X-Ray Absorption Edge of Graphite Evaluated from the Lower Limit of Resonant Inelastic X-Ray Scattering

抄録

We experimentally determined the X-ray absorption edge in the C K region of graphite using selectively-excited X-ray emission spectroscopy. The selectively-excited X-ray emission measurements of normal X-ray fluorescence, resonant inelastic X-ray scattering (RIXS), and X-ray Raman scattering (XRS) using synchrotron radiation were performed at the Advanced Light Source. The spectral border between RIXS and XRS can be evaluated from the relationship between the energy positions of the main emission peaks and their excitation energies. Thus, the X-ray absorption edge in the C K region at the lower limit of RIXS is 284.1 eV for graphite.