2018 年 37 巻 4 号 p. 568-574
The purpose of this study was to investigate the formation of acid-base resistant zone (ABRZ) of enamel surface during bracket bonding by using three self-etch adhesives presently available in the orthodontic treatment. Also, the relation between the thickness of the ABRZ and bonding strength, the relation between the thickness of the ABRZ and the concentration of fluoride ions contained in the adhesives, were discussed respectively. The ABRZ was formed with all self-etch orthodontic adhesives. ABRZ thicknesses of two self-etch adhesives were approximately 0.8–1.0 μm, whereas ABRZ thickness of other one was about 0.1 μm. The bond strengths of all self-etch orthodontic adhesives indicated over 10 MPa, and ABRZ thickness observed in the enamel surface seemed to have no influence to the bond strengths among self-etch adhesives. Moreover, the thickness of ABRZ appeared to be associated with the amount of fluoride ion released from the primer.
