e-Journal of Surface Science and Nanotechnology
Online ISSN : 1348-0391
ISSN-L : 1348-0391
Conference Papers -ALC'03-
Atom Selective Imaging and Mechanical Atom Manipulation based on Noncontact Atomic Force Microscope Method
Seizo MoritaNoriaki OyabuRyuji NishiKenji OkamotoMasayuki AbeÓscar CustanceInsook YiYoshihide SeinoYasuhiro Sugawara
著者情報
ジャーナル フリー

2003 年 1 巻 p. 158-170

詳細
抄録
We investigated performances and functions of the noncontact atomic force microscope (NC-AFM) method. As a result, we found that the NC-AFM functions not only as the atomic resolution microscope but also novel atomic tools based on a mechanical method as follows; a three-dimensional mapping tool of atomic force between the tip and sample atoms, a discrimination tool of atomic force mechanisms and atom species of the sample surface, a control tool of atomic force and atom position on the sample surface, and an atom manipulation tool. [DOI: 10.1380/ejssnt.2003.158]
著者関連情報

この記事はクリエイティブ・コモンズ [表示 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by/4.0/deed.ja
前の記事 次の記事
feedback
Top