抄録
The electronic structure of the (5× 1) TiO2 film on Ag(100) has been investigated with photoemission spectroscopy utilizing synchrotron radiation. The film was prepared by Ti deposition on Ag(100) at room temperature in an O2 atmosphere at 5× 10-6 Torr and subsequent annealing at 600°C for 3 min. The valence band of the film was observed in the binding energy region of 4-10 eV. The spectral intensity of the valence band of the film was maximized at the photon energies of 48 eV and 54 eV, which were ascribed to the resonances caused through the interference between the normal photoemission process and the process including Ti 3p → 3d and 3p → 4s excitations, respectively. Resonant photoemission measurements showed that the valence band of the film in the region of 5-10 eV are formed by hybridization of the O 2p oribitals with both the Ti 3d and 4s orbitals, while the top region of the valence band is mostly composed of the O 2p components. [DOI: 10.1380/ejssnt.2012.286]
