抄録
It is important to study the distribution of host and guest molecules in organic electroluminescence materials because their distribution dramatically affects the functionalities of these materials. In order to understand this distribution, a new analysis method should be developed to obtain sub-nanometer scale information. In this regard, we used Atom Probe Tomography (APT). APT is a three-dimensional analysis technique with sub-nanometer scale resolution and is frequently used in material science and engineering. There are many reports on the analysis of inorganic materials using APT analysis, however only a few studies report the analysis of organic materials because of difficulties in the sample preparation, measurements, and the three-dimensional reconstruction of organic materials. In this study, we focused on developing a new sample preparation method and suggested the new sample preparation method for the analysis of organic materials. This new preparation method needs only a small amount of organic materials for analysis. Moreover, it is very simple and combines electrolytic polishing with the dipping method. [DOI: 10.1380/ejssnt.2016.154]
