e-Journal of Surface Science and Nanotechnology
Online ISSN : 1348-0391
ISSN-L : 1348-0391
Conference -ISSS-4-
Adsorption behavior of (CH3)2S on sputtered and annealed Rh(100) surface by AFM, XPS and NEXAFS
T. NomotoS. YagiK. SodaG. KutlukH. SumidaE. HashimotoM. Taniguchi
著者情報
キーワード: Rh(100), Surface Morphology, AFM, XPS, NEXAFS
ジャーナル フリー

2006 年 4 巻 p. 39-45

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抄録
The temperature dependent reaction of dimethyl sulfide (CH3)2S : DMS on Rh(100) over the temperature range of 90-300 K and the surface reaction of DMS depending on the morphology of Rh(100) surface have been studied with Atomic Force Microscopy (AFM), X-ray Photoelectron Spectroscopy (XPS) and Sulfur K-edge Near Edge X-ray Absorption Fine Structure (NEXAFS) techniques. DMS molecules adsorb molecularly on 850 K annealed Rh(100) surface at 90 K, and some of DMS are dissociated into methanethiolate CH3S- : MT or atomic sulfur as the temperature of the substrate increases. The temperature dependent reduction of the total coverage of sulfur indicates that some of sulfur-containing molecules desorb from the surface. On the other hand, it is found that DMS decomposes into atomic S on 1000 K annealed Rh(100) surface at 90 K. These results indicate that the dissociative reaction of DMS/Rh(100) is more sensitive to the surface morphology than that of Cu(100). [DOI: 10.1380/ejssnt.2006.39]
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この記事はクリエイティブ・コモンズ [表示 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by/4.0/deed.ja
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