Local electronic structure analysis using a photoelectron emission microscope (PEEM) with hard X-ray

抄録

We demonstrate a new use for photoelectron emission microscopy (PEEM) in combination with hard X-ray synchrotron radiation. With this technique, an X-ray absorption fine structure spectrum can be acquired on each pixel in the observed image, thereby enabling analysis of the electronic properties in nanometer scale. Here, we report the local chemical composition and electronic structure of the Widmanstätten pattern in the Gibeon iron meteorite and clarify that the α lamella exhibits bcc structure with a spatially homogeneous Fe concentration. [DOI: 10.1380/ejssnt.2006.490]