Growth Mode and Surface Structure of Cr Ultrathin Film on Fe/Cu(001)

Satoshi Tohoda; Mirai Nagira; Tetsuro Ueno; Tetsuro Tagashira; Akio Kimura; Masahiro Sawada; Hirofumi Namatame; Masaki Taniguchi

doi:10.1380/ejssnt.2008.251

Conference -ISSS-5-

Growth Mode and Surface Structure of Cr Ultrathin Film on Fe/Cu(001)

Satoshi Tohoda, Mirai Nagira, Tetsuro Ueno, Tetsuro Tagashira, Akio Kimura, Masahiro Sawada, Hirofumi Namatame, Masaki Taniguchi

著者情報

キーワード: Magnetic films, Low energy electron diffraction (LEED), Reflection high-energy electron diffraction (RHEED), Iron, Chromium

ジャーナルフリー

2008 年 6 巻 p. 251-253

DOI https://doi.org/10.1380/ejssnt.2008.251

詳細

抄録

We hereby report a growth mode and surface structure of ultrathin Cr films on fcc Fe/Cu(001). We have found a clear RHEED intensity oscillation during Cr deposition up to four monolayers on 3 and 6 ML Fe/Cu(001), indicating an layer-by-layer growth. Besides, the observed (2×1) LEED pattern at low Cr thickness is similar to that of fcc Fe/Cu(001) in the 5-11 ML thickness range. We have also demonstrated the Cr/Fe multilayer growth with single monolayer of Cr inserted between fcc Fe layers. [DOI: 10.1380/ejssnt.2008.251]

責任著者(Corresponding author)

J-STAGEへの登録はこちら（無料）