IEICE Electronics Express
Online ISSN : 1349-2543
ISSN-L : 1349-2543
ERRATA
Erratum: The impact of trapping centers on AlGaN/GaN resonant tunneling diode [IEICE Electronics Express Vol. 10 (2013) No. 19 pp. 20130588]
Haoran Chen, Lin'an Yang, Xiaoxian Liu, Zhangming Zhu, Jun Luo, Yue Hao
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JOURNAL FREE ACCESS

2013 Volume 10 Issue 24 Pages 20138002

J-STAGE : elex 10 19 pp.20130588-20130588
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© 2013 by The Institute of Electronics, Information and Communication Engineers
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