抄録
It is accepted that the electromagnetic interference should be addressed with statistical analysis. Usually the impact of electromagnetic interference on different electronic samples is evaluated and the average immunity level is used as a reference. However, this method does not provide enough information to know the probability of failure to the electromagnetic interferences of an electronic circuit. An alternative statistical analysis based on the Weibull distribution is presented. The typical and proposed methods have been compared in order to analyse the electromagnetic immunity performance of two types of operational amplifier. The results confirm the feasibility of the proposed method.
