IEICE Electronics Express
Online ISSN : 1349-2543
ISSN-L : 1349-2543
LETTER
Flexible block management with data migration wear-leveling algorithm for phase change memory
Mi ZhouXiaogang ChenShunfen LiYueqing WangYifeng ChenGezi LiYuchan WangZhitang Song
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2014 年 11 巻 22 号 p. 20140924

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Phase change memory (PCM) is regarded as a powerful competitor for future non-volatile memory applications. However, a key drawback is its limited write endurance. This paper proposes a flexible block management method with data migration wear-leveling algorithm (FBDM). The proposed method divides blocks into two halves meanwhile blocks can be split and merged flexibly. Data migration wear-leveling algorithm has been presented to extend the life of PCM. We simulated our method using different traces and compare it with previous methods. Simulation results show that the proposed method outperforms comparison methods in terms of wear evenness and overhead reduction.

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© 2014 by The Institute of Electronics, Information and Communication Engineers
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