IEICE Electronics Express
Online ISSN : 1349-2543
LETTER
Temperature and voltage droop-aware test scheduling during scan shift operation
Taehee LeeYongjoon KimJoon-sung Yang
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JOURNALS FREE ACCESS

2016 Volume 13 Issue 18 Pages 20160581

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Abstract

Hotspots and voltage droops have become critical problems during scan test. They are minimized by dynamically varying clock frequency during scan shift operation. We control average and peak temperature by adjusting the clock frequency assigned to each core. This proposed method is applied to multi-core System-on-Chip (SoC). Experimental results show that our method achieves 28% peak temperature reduction and 38% average temperature reduction.

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© 2016 by The Institute of Electronics, Information and Communication Engineers
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