IEICE Electronics Express
Online ISSN : 1349-2543
LETTER
An offset distribution modification technique of stochastic flash ADC
Tomohiro AsanoYusaku HiraiSadahiro TaniShinya YanoIkkyun JoToshimasa Matsuoka
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2016 Volume 13 Issue 6 Pages 20160115

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Abstract

A new non-linearity reduction technique for stochastic flash ADC (SF-ADC) is proposed, focusing on distribution of comparator input-referred offsets. The SF-ADC test chip fabricated in a 130-nm CMOS process demonstrated the proposed technique can improve SNDR. In addition, the digital re-quantization also can improve the linearity more, where quantization level and fractional correction can be optimized using genetic algorithm.

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© 2016 by The Institute of Electronics, Information and Communication Engineers
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