IEICE Electronics Express
Online ISSN : 1349-2543
ISSN-L : 1349-2543
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Column readout circuit with dual integration CDS for infrared imagers
Yujin ParkHan YangJeahyun AhnSuhwan Kim
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2016 Volume 13 Issue 7 Pages 20151037

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Abstract

A column readout circuit with proposed dual integration CDS for low pattern noise infrared imager is presented. By using an extra integration, the dual integration CDS effectively reduces the level of column and row noise (CN and RN) and column fixed pattern noise (CFPN) in an infrared image. In addition, a time flexible integration technique minimizes the penalty of readout time by a dual operation. Simulation of a 0.18 µm CMOS implementation suggests that CN can be reduced by 68%, RN by 71%, and CFPN by 95% compared with a column readout circuit with conventional CDS.

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© 2016 by The Institute of Electronics, Information and Communication Engineers
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