A single event transient detector in SRAM-based FPGAs

Xiumin Xu; Huaguo Liang; Zhengfeng Huang; Cuiyun Jiang; Yingchun Lu; Aibin Yan; Tianming Ni; Maoxiang Yi

doi:10.1587/elex.14.20170210

LETTER

A single event transient detector in SRAM-based FPGAs

Xiumin Xu, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Yingchun Lu, Aibin Yan, Tianming Ni, Maoxiang Yi

Author information

Keywords: single event transient, pulse detector, on-chip measure, SRAM-based FPGAs

JOURNAL FREE ACCESS

2017 Volume 14 Issue 12 Pages 20170210

DOI https://doi.org/10.1587/elex.14.20170210

Browse “Advance online publication” version

Details

Abstract

This paper presents a novel single event transient (SET) measurement circuit in SRAM-based field programmable gate arrays (FPGAs). Experimental results demonstrate that the new pulse detector is able to on-chip measure bipolar pulses with a detection limit of near 150 ps, compared with existing pulse detectors, detection capability and detection precision are effectively improved.

Corresponding author

Register with J-STAGE for free!