A single event transient detector in SRAM-based FPGAs

Xiumin Xu; Huaguo Liang; Zhengfeng Huang; Cuiyun Jiang; Yingchun Lu; Aibin Yan; Tianming Ni; Maoxiang Yi

doi:10.1587/elex.14.20170210

LETTER

A single event transient detector in SRAM-based FPGAs

Xiumin Xu, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Yingchun Lu, Aibin Yan, Tianming Ni, Maoxiang Yi

著者情報

キーワード: single event transient, pulse detector, on-chip measure, SRAM-based FPGAs

ジャーナルフリー

2017 年 14 巻 12 号 p. 20170210

DOI https://doi.org/10.1587/elex.14.20170210

Browse “Advance online publication” version

詳細

抄録

This paper presents a novel single event transient (SET) measurement circuit in SRAM-based field programmable gate arrays (FPGAs). Experimental results demonstrate that the new pulse detector is able to on-chip measure bipolar pulses with a detection limit of near 150 ps, compared with existing pulse detectors, detection capability and detection precision are effectively improved.

責任著者(Corresponding author)

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