A novel test data compression approach based on bit reversion

抄録

Test data compression is an effective methodology for reducing test data volume and testing time. This paper presents a new test data compression approach based on bit reversion, which compresses data more easier by reversing some test data bits without changing the fault coverage. As there are some don’t care bits in test set, when they are filled, many faults will be repeatedly detected with multiple vectors. Correspondingly, a lot of bits in the test set can be modified without affecting the fault coverage. Experimental results show that the proposed method can increase compression ratio of code-based schemes by around 10%.