IEICE Electronics Express
Online ISSN : 1349-2543
ISSN-L : 1349-2543
NOTIFICATION
Retraction:Reliability assurance in early-life-failure test through improved nearest neighbor regression
Tai Song, Huaguo Liang, Zhengfeng Huang, Jie Hou
Author information
JOURNAL FREE ACCESS

2020 Volume 17 Issue 2 Pages 20190696

Browse “Advance online publication” version
Details
Download PDF (3312K)
Download citation RIS

(compatible with EndNote, Reference Manager, ProCite, RefWorks)

BIB TEX

(compatible with BibDesk, LaTeX)

Text
How to download citation
Contact us
Abstract

This article was retracted. Please see retracted notification.

Content from these authors
© 2020 by The Institute of Electronics, Information and Communication Engineers
Previous article
Favorites & Alerts

Recently viewed articles
Share this page
feedback
 Top