2021 年 18 巻 24 号 p. 20210451
Logic BIST is a safety mechanism, which performs testing for Automotive electronics. However, pseudorandom LBIST patterns results in increased test time and test power. In this letter, a novel time multiplexed LBIST is presented to overcome test related problems of AI accelerators. First, the accelerator array is divided into smaller sub arrays, which are tested on time multiplexed clock cycles. This: 1) improves overall test time, under the given test power limit, 2) allows reduction in shift power, under given test time limits and 3) since only one sub array is clocked at a time, the peak power is reduced.
