IEICE Electronics Express
Online ISSN : 1349-2543
ISSN-L : 1349-2543
LETTER
Novel radiation-hardened latch design for space-radiation environments
Qiang ZhaoHanwen DongLicai HaoXiuying WangChunyu PengXiulong Wu
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2022 Volume 19 Issue 13 Pages 20220170

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Abstract

With the continuous progress of complementary metal-oxide-semiconductor (CMOS) technology, the size of memory is constantly reduced, which greatly increases the probability of the chip being interfered by radiation particles in the space environment. The traditional latch is no longer suitable for the space radiation environment. In this paper, a Radiation-hardened Polarity design Latch (RHPDL) circuit is proposed. The internal storage nodes of the cell are surrounded by full NMOS transistor or full PMOS transistor, which reduces the number of sensitive nodes and improves the circuit stability, making the circuit not only resistant to single node upset (SNU), but also resistant to double nodes upset (DNU). A fast data path is used between the input and output of the RHPDL cell to reduce the delay of data transmission. Compared with: T-latch, ST, DICE, TPDICE, RH, FERST, HSMUF, CLCT, and RFC, RHPDL improves the transmission speed of 8.3×, 11.86×, 17.68×, 14.13×, 1.09×, 15.11×, 1.4×, 15.85×, and 2.66×, respectively, at the cost of smaller area and power consumption. RHPDL with its fast transmission speed and strong robustness can work well in space radiation environment.

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© 2022 by The Institute of Electronics, Information and Communication Engineers
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