Modeling and simulation research on conducted immunity of power module of digital control circuit based on transient EMI

Abstract

In order to study the coupling mechanism of the transient immunity of digital control circuits, the equipment of digital control circuits is developed in order to obtain a general method of modeling and simulation of the transient immunity. The power module of the digital control circuit is its basic function module. This paper extracts the characteristic parameters of the EMI coupling path of the digital control circuit and establishes an equivalent circuit, based on the established RFI-based power module conductive immunity model. A method of port response simulation for power module of digital control circuit under transient interference based on transfer function and segmental circuit simulation is proposed. This method has a certain value for studying the coupling mechanism of conductive interference.