IEICE Electronics Express
Online ISSN : 1349-2543
ISSN-L : 1349-2543
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A 2-stage-pipelined 16 port SRAM with 590Gbps random access bandwidth and large noise margin
Koh JohguchiYuya MukudaKen-ichi AoyamaHans Jürgen MattauschTetsushi Koide
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ジャーナル フリー

2007 年 4 巻 2 号 p. 21-25

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抄録
A 90nm CMOS, 64Kbit, 1.16GHz, 16 port SRAM with multi-bank architecture realizing 590Gbps random access bandwidth, 41mW power dissipation at 1GHz and 0.91mm2 (13.9µm2/bit) area consumption is reported. Compared to conventional 16 port SRAM data, area and power consumption are reduced by factors 16 and 5, respectively, while maximum clock frequency is about a factor 2 higher.
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© 2007 by The Institute of Electronics, Information and Communication Engineers
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