抄録
Test power and test overhead are crucial to VLSI and SOC testing. This paper proposes a low cost test pattern generator (TPG) for test-per-clock built-in self-test (BIST) scheme. The proposed method utilizes a two-dimensional TPG and a bit-XOR array to reduce area overhead, and generates single input change (SIC) sequences to reduce input transitions of the circuit under test (CUT). Simulation results on ISCAS benchmarks demonstrate that the proposed method can achieve high fault coverage and effectively reduce test power.
