Noise margin and short-circuit current in FGMOS logics

抄録

Even when floating-gate logics are very-low-voltage circuits, as power supply is reduced, large fan-in FGMOS gates are prone to fail. Thus, determining the negative impact of noise margin and short-circuit current in this type of circuits is crucial to achieve optimal operation for a particular application. For this reason, a systematic and reliable technique for obtaining the correlation between fan-in and supply voltage, simultaneously considering noise margin and short-circuit current, is proposed.