IEICE Electronics Express
Online ISSN : 1349-2543
High stability current supply design for atomic resolution electron microscopy
Maryam M. MotamediMichael S. Isaacson
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Volume 9 (2012) Issue 20 Pages 1586-1591

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Abstract

An integrated ultra stable current supply architecture for use in atomic resolution electron microscopy has been proposed, designed, and simulated. The system is designed to have an overall stability of .01ppm/°C, with similar stability for 20% changes in line voltage, and a drift in current of approximately 6×10-10min-1, all at 1A output current.

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© 2012 by The Institute of Electronics, Information and Communication Engineers
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