J-STAGE Home  >  Publications - Top  > Bibliographic Information

IEICE Electronics Express
Vol. 9 (2012) No. 20 pp. 1586-1591



An integrated ultra stable current supply architecture for use in atomic resolution electron microscopy has been proposed, designed, and simulated. The system is designed to have an overall stability of .01ppm/°C, with similar stability for 20% changes in line voltage, and a drift in current of approximately 6×10-10min-1, all at 1A output current.

Copyright © 2012 by The Institute of Electronics, Information and Communication Engineers

Article Tools

Share this Article