抄録
This paper presents a high-linear bootstrapped sampling switch for high-speed applications. The proposed switch utilizes bootstrapping technique of both NMOS and PMOS types simultaneously. Thus, results in a low-variation low-value on-resistance switch. Using this idea, the proposed switch considers reliability constrains, and operates in full-swing input range. Furthermore, it is suitable for standard n-well CMOS technology. Simulation results show that proposed switch achieves on-resistance variation of less than 4% through full-range input signal.
