IEICE Electronics Express
Online ISSN : 1349-2543
ISSN-L : 1349-2543
LETTER
Low-energy block-level instantaneous comparison 7T SRAM for dual modular redundancy
Shunsuke OkumuraYohei NakataKoji YanagidaYuki KagiyamaShusuke YoshimotoHiroshi KawaguchiMasahiko Yoshimoto
著者情報
キーワード: SRAM, 7T bitcell, comparison circuit, DMR
ジャーナル フリー

2012 年 9 巻 6 号 p. 470-476

詳細
抄録
This paper proposes a 7T SRAM that realizes a block-level instantaneous comparison feature. The proposed SRAM is useful for operation results comparison in dual modular redundancy (DMR). The data size that can be instantaneously compared is scalable using the proposed structure. The 1-Mb SRAM comprises 16-Kb blocks in which 8-Kb data can be compared in 130.0ns. The proposed scheme reduces energy consumption in data comparison to 1/418, compared to that of a parallel cyclic redundancy check (CRC) circuit.
著者関連情報
© 2012 by The Institute of Electronics, Information and Communication Engineers
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