IEICE Electronics Express
A method for the fast diagnosis of multiple defects using an efficient candidate selection algorithm
Yoseop LimJaeseok ParkSungho Kang
Author information
JOURNALS FREE ACCESS

Volume 9 (2012) Issue 9 Pages 834-839

Details
Download PDF (1459K) Contact us
Abstract

The demand for fault diagnosis has increased with the increasing complexity of VLSI devices. Recent analysis has found that multiple defects frequently exist in failing chips. Therefore, the diagnosis of multiple defects is very important and is needed in the industry. Here we propose a multiple-defect diagnosis method using an efficient selection algorithm that can handle various defect behaviors. The experimental results for the full-scan version of the ISCAS ’89 benchmark circuits demonstrate the efficiency of the proposed methodology in diagnosing circuits that are affected by a number of different types of defects.

Information related to the author
© 2012 by The Institute of Electronics, Information and Communication Engineers
Previous article Next article

Recently visited articles
feedback
Top