A low-overhead error detection and correction technique with a relaxed error timing constraint for variation-tolerance

抄録

Variation poses a guard-band requirement for integrated circuit designs, which degrades performance and energy efficiency. As the voltage scales down, the circuits are more sensitive to the variation and the guard-band margin becomes unacceptable. In this paper, we propose a novel error detection and correction technique to eliminate the margin for variation. The error detection latch introduces the low overhead of only 6 transistors compared to the conventional latch. The detection and correction scheme relaxes the timing constraint for the error signal by one clock cycle by extending another latch stage next to the critical stage. The proposed technique reduces the energy per cycle by 51% with 7.6% area overhead compared to the conventional margin technique. Comparison with other works in the state of art shows the proposed technique is quite competitive.