A dV/dt noise canceling circuit of capacitive-isolated gate drivers

Xuefei Zhang; Tiantian Liu; Yuhua Quan; Xiaoyi Huang; Xinhong Cheng; Yuehui Yu

doi:10.1587/elex.19.20220338

This article has now been updated. Please use the final version.

A dV/dt noise canceling circuit of capacitive-isolated gate drivers

Xuefei Zhang, Tiantian Liu, Yuhua Quan, Xiaoyi Huang, Xinhong Cheng, Yuehui Yu

Author information

Xuefei Zhang
The State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology
The Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences
Tiantian Liu
The State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology
The Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences
Yuhua Quan
The State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology
The Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences
Xiaoyi Huang
The State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology
The Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences
Xinhong Cheng
The State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology
The Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences
Yuehui Yu
The State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology
The Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences

Keywords: capacitive-isolated gate driver, CMTI, propagation delay

JOURNAL FREE ACCESS Advance online publication

Article ID: 19.20220338

DOI https://doi.org/10.1587/elex.19.20220338

The final version of this article is now available: Vol. 19 (2022), No. 21 pp. 20220338-20220338

Details

Abstract

For capacitive-isolated gate drivers, the pulse width distortion (PWD) and common mode transient immunity (CMTI) are vital factors to evaluate its performance. In this paper, an envelope detection circuit and a dV/dt noise canceling circuit of capacitive-isolated gate drivers is designed based on X-FAB 0.35μm CMOS process. With these structures, this gate driver alleviates PWD and improve CMTI. Spectre simulation results show that the gate driver achieves 200kV/μs CMTI with 50ns propagation delay and maximum 7.4ns PWD. Besides, it has better robustness to fabrication process and temperature variation than conventional methods.

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