抄録
We developed a XAFS measurement system applicable for various sample conditions at the soft X-ray double crystal monochromator beamline (BL-10) of the SR center, Ritsumeikan University. The measurement system consists of two directly connected chambers; one in high vacuum with a newly-developed sample transfer system and another in 1 atm He. A sample decomposed by evacuation can be measured in 1 atm He gas chamber, while a sample unstable in air can be prepared in a glove box, transferred with a transfer vessel and installed in a high vacuum chamber without exposing to air. This system opens a new applicability of XAFS measurements in the soft X-ray region.
