抄録
We have developed a three-dimensional shape measurement technique using the optimal intensity-modulation pattern projection method that provides three-dimensional information from a single pattern projection. The practical use of the technique is expected in the near future. However, when the color distribution and surface reflections of the target are complex, to cancel their influence, it is necessary to use another observation image as a reference to correct the intensity of the observed pattern. In this study, we propose an analysis method with an original color system and image correction technology to realize three-dimensional measurement using only one observation image.
