電気学会論文誌C(電子・情報・システム部門誌)
Online ISSN : 1348-8155
Print ISSN : 0385-4221
ISSN-L : 0385-4221
<情報通信工学>
空洞共振器を用いた誘電体薄膜のミリ波帯における誘電特性測定
吉川 博道中山 明
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2011 年 131 巻 7 号 p. 1287-1292

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A novel cavity resonator method was proposed for measuring the complex permittivity of dielectric plate and film in the millimeter-wave region. In this method, the dielectric plate with film was loaded at the end of the cavity resonator. The measurement principle and the measurement error of the dielectric film were discussed. The complex permittivities of dielectric films were measured at 30 GHz.

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