電気学会論文誌A(基礎・材料・共通部門誌)
Online ISSN : 1347-5533
Print ISSN : 0385-4205
ISSN-L : 0385-4205
ラマン散乱分光法によるZnSe-ZnTe短周期超格子の構造評価
竹村 泰司小長井 誠
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1993 年 113 巻 11 号 p. 749-754

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Structure of ZnSe-ZnTe short-period superlattices prepared by atomic layer epitaxy was studied. X-ray diffraction and transmission electron microscopy measurements indicated that the sample formed a fine superlattice structure which had an abrupt interfaces. This paper reports the lattice strain and lattice vibration in the superlattice which were investigated by Raman scattering spectroscopy. It was found that the obtained superlattices were strained under free-standing configuration and that the phonon frequency was affected by the effect of short-periodicity for the structure with layers less than 4 monolayers. Lattice vibration in ZnSe-ZnTe superlattice was proposed, which was different from that in GaAs-AlAs superlattice.
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