IEEJ Transactions on Sensors and Micromachines
Online ISSN : 1347-5525
Print ISSN : 1341-8939
ISSN-L : 1341-8939
Discussion on System Non-uniformity and Sensitivity Improvement for 2-dimensional Birefringence Vector Distribution Measurement
Takehiro KoyamaYongchang ZhuTatsuo TakadaYoshihiro MurookaToshihisa Otsuka
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1998 Volume 118 Issue 10 Pages 467-474

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Abstract
A two-dimensional measurement method for a birefringence vector distribution differs from a point measurement not only in the two-dimensional system non-uniformity, but also in the system reliability. An optical phase pulsed modulation is employed to simplify the two-dimensional mathematical analysis. As a result, concepts are proposed of the system function, which characterizes the system non-uniformity resulting from the system components, and of the intrinsic function, which is related to the birefringent sample. The influence of the system non-uniformity on the two-dimensional measurement is eliminated by measurement of the intrinsic function while its two values allow the mathematical separation of the birefringence vector components. The effectiveness of the two-dimensional analysis is illustrated by the measurement of a birefringence vector distribution induced by an internal stress distribution in a PMMA plate due to the photo-elastic effect.
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