Effects of Defective Bypass Diodes and Forced Voltage Fluctuation Caused by PCS on PV String Current Characteristics

KHIN May Oo; LATT Nay Zaw; TORIHARA Ryo; SAKODA Tatsuya; HAYASHI Noriyuki

doi:10.11527/jceeek.2020.0_371

2020年度電気・情報関係学会九州支部連合大会（第73回連合大会）講演論文集

セッションID: 02-2P-08

DOI https://doi.org/10.11527/jceeek.2020.0_371

会議情報

主催: 電気・情報関係学会九州支部連合大会委員会

会議名: 2020年度電気・情報関係学会九州支部連合大会

回次: 73

開催地: オンライン開催（大会本部：九州産業大学）

開催日: 2020/09/26 - 2020/09/27

Effects of Defective Bypass Diodes and Forced Voltage Fluctuation Caused by PCS on PV String Current Characteristics

*KHIN May Oo, LATT Nay Zaw, TORIHARA Ryo, SAKODA Tatsuya, HAYASHI Noriyuki

著者情報

会議録・要旨集フリー

詳細

抄録

This paper demonstrates the effects of defective bypass diodes and forced voltage fluctuation caused by PCS on the string current characteristics of multi-cluster PV string based on LTspice® simulation.It is observed that the asymmetrical behaviors of string current characteristics become more significant when smaller number of the bypass diodes are resistive in the PV string and degree of asymmetrical string current variations greatly depends on the amplitudes of voltage fluctuation.

責任著者(Corresponding author)

会議情報

J-STAGEへの登録はこちら（無料）