日本結晶成長学会誌
Online ISSN : 2187-8366
Print ISSN : 0385-6275
ISSN-L : 0385-6275
GaSb CZ結晶中のマイクロファセット : I. 成長誘起不純物偏析現象
熊川 征司早川 泰弘
著者情報
ジャーナル フリー

1986 年 13 巻 2-3 号 p. 131-135

詳細
抄録
GaSb single crystals containing Te as an impurity were pulled from the melt by the Czochralski method. Microfacets concerning with local segregation phenomena were investigated in these crystals. They appeared when deep holes on irregular crystal surfaces caused by remelting were filled in with bulk material during regrowth. Furthermore, line patterns showing a sawtoothed shape were observed in the transition region between peripheral facet and off-facet regions. They were formed with {111} facet planes. A macrofacet region developed from a microfacet was also found in pulled crystals.
著者関連情報
© 1986 日本結晶成長学会
前の記事 次の記事
feedback
Top