日本結晶成長学会誌
Online ISSN : 2187-8366
Print ISSN : 0385-6275
ISSN-L : 0385-6275
17pB08 Si(100)基板上へのBP(100)エピタキシャル成長と評価(半導体エピ(4),第35回結晶成長国内会議)
竹内 智彦西村 鈴香佐久間 智教松本 智寺嶋 一高
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2005 年 32 巻 3 号 p. 147-

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Today, the substrates using for the study of c-GaN growth are mainly GaAs and 3C-SiC wafer. However, these have a large lattice mismatch, about 20% and 3.3% respectively. In our study, Boronmonophosphide grown on Si(100) by MOCVD is using for c-GaN substrate. The lattice mismatch between BP(100) and c-GaN(100) is about 0.7%. The growth and characterization of BP epitaxial wafer using for the growth of c-GaN substrate will be reported at the meeting.

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© 2005 日本結晶成長学会
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