精密機械
Print ISSN : 0374-3543
比較測長器に対する温度変化の影響(第4報)
鈴木 幸雄
著者情報
ジャーナル フリー

1955 年 21 巻 250 号 p. 520-524

詳細
抄録

The writer investigated the inherent error response of a microlux corresponding to the periodic ambient temperature change. An experiment was performed in the controlled temperature box provided with a thermostat, and the different periods of temperature change were used.
Accoding to the results, we can conclude that the time lag of the inherent error response is almost due to the shape or quality of the comparator stand and not to the period of ambient temperature changes.
Furthermore, by means of a superposition of the solution above mentioned, we can conclude the time lag when the ambient temperature and the corresponding inherent reading error of the microlux become steady.

著者関連情報
© 社団法人 精密工学会
前の記事 次の記事
feedback
Top