抄録
Full characterization of complex materials with ultra-thin film structures or nanostructures can rarely be accomplished with a single analysis technique. X-ray Photoelectron Spectroscopy (XPS) has often been complemented with Ultra-violet Photoelectron Spectroscopy (UPS), ion scattering data or electron microscopy. This presentation will show how the addition of in-situ Raman spectroscopy to an XPS surface analysis system can help to characterize 2D nano-materials such as graphene, by adding chemical and bulk information to surface information all obtained from the same analysis position on the sample.
