Proceedings of International Conference on Leading Edge Manufacturing in 21st century : LEM21
Online ISSN : 2424-3086
ISSN-L : 2424-3086
2007.4
セッションID: 8D413
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Micro Deformation of Probe by Polarized Laser Irradiation and its Application to Sub-micron Positioning
*Naoki NARUOAkira KAKUTAYuji FURUKAWA
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Sub-micron expansion process of micro-bar such as probes has been observed when irradiated by a polarized Ultra Violet (UV) laser. Influences of laser polarization, laser fluence, micro-bar size, its crystallographic orientation and heat have been investigated. It could show that the expansion is not influenced by a thermal cause, rather, suggested that the cause comes from the change of crystal lattice distance.
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© 2007 The Japan Society of Mechanical Engineers
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