主催: The Japan Society of Mechanical Engineers
会議名: 第10回 21世紀における先端生産工学・技術に関する国際会議 (LEM21)
開催日: 2021/11/14 - 2021/11/18
In recent years, the industrial application of deep learning to visual inspection has been progressing along with the development of image recognition research. However, we can point out three problems with the application of deep learning to visual inspection. First, computer resources are limited when considering embedded systems. Second, tact time should be short for in situ inspection in mass-production processes. Third, high accuracy is required because overlooking a defective product can be fatal. In this study, we propose a method to build a highly accurate, lightweight, and fast inference deep learning model using a compression method called “filter-level pruning”.