年次大会
Online ISSN : 2424-2667
ISSN-L : 2424-2667
セッションID: J012024
会議情報
J012024 粘弾性積層体の反り変形量に及ぼす冷却条件と層構成の影響([J012-02]電子情報機器、電子デバイスの強度・信頼性評価と熱制御(2))
中村 省三桑野 孝之勝山 陽介
著者情報
会議録・要旨集 フリー

詳細
抄録
A lot of semiconductor packages are used for electronic parts in telecommunication equipment. Semiconductor packages are made of different kinds of material which form multilayer laminate in structure. The warp has developed difference of physical properties of material. Thermosetting-resin of epoxy resin is mainly used for the encapsulant of semiconductor package. In this report, warp has developed noteworthy by cooling process and layer structure. The model is simple two-layer-laminated structure, which is the subject of an experiment in an epoxy resin/steel. These laminated structures heat at constant temperature of 180℃, and a chain of thermal loading until cooling is given. As a result, the theory is possible to estimate warp deformation of laminated structure.
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© 2013 一般社団法人 日本機械学会
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