ロボティクス・メカトロニクス講演会講演概要集
Online ISSN : 2424-3124
セッションID: 2P2-B01
会議情報

画像処理を利用した外観比較検査システムの研究開発
*波野 奎友穴井 達久池井 茂
著者情報
会議録・要旨集 フリー

詳細
抄録

This paper describes a new method to recognize the product's defect by using image processing. By using image processing in visual inspection, it is possible to automate the visual inspection which has been done by human eye. This system has three traits. First, this system can get the defect's region by comparing the product's picture with its superior one instead of defect detection which using threshold value. By using this method, it can be strong against external disturbance such as light sources and product color. Second, it uses image processing to judge the defects multifacetedly from the area, strength of the defect, and difference in luminance. Third, this system uses Support Vector Machine to evaluate defect. So, it is possible to set the difference between clear small defects, and indistinct large defects.

著者関連情報
© 2018 一般社団法人 日本機械学会
前の記事 次の記事
feedback
Top