表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
第35回表面科学学術講演会特集号 [II]
オージェ電子分光分析法による界面近傍の分析
—超硬工具基材への応用—
奥村 洋史峰 和久
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2016 年 37 巻 8 号 p. 359-362

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Auger electron spectroscopy (AES) was used to determine the concentration of W atoms diffused into a Co region across a WC/Co interface in a tungsten carbide tool. Direct analysis near the WC/Co interface by AES is difficult because of backscattering. We propose a practical method that considers backscattering in estimating the W concentration across the interface. We prepared a WC/Co model specimen with negligible diffusion of W into the Co region. We confirmed that the backscattering component in AES line profiles across the interface was reproduced by using a Monte Carlo (MC) code. Then, we measured AES line profiles over a WC/Co/WC region in a real tungsten carbide tool and calculated profiles without W diffusion into the Co region by the MC code. We estimated the W distribution in the Co region by considering backscattering, and subtracted the calculated profile from the measured profile to remove the backscattering component.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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