抄録
Vanadylphthalocyanine (VOPc) thin films with thicknesses from 100 nm to 300 nm were prepared by a molecular beam epitaxy method on KCl substrate. The molecular orientation and phase morphologies in VOPc thin film deposited on KCl substrate were investigated by Vis/UV spectra measured with each sample using a Vis/UV spectrophotometer, AFM images were measured using atomic force microscopy and the laser light incident angle dependences of second and third harmonic (SH and TH) intensities were measured by the Maker fringe method using an Nd-YAG laser. It is commonly understood that the VOPc thin film prepared on the KCl substrate has three types of phase morphology. One is epitaxy, two is the pseudomorphic layer and three is Phase I. For a thickness of 300 nm, the phase morphology which appeared in the surface neighborhood differs from the three types. The relationship between the new phase morphology and the TH intensity is analyzed using a theoretical method.
