抄録
Special type of microscope has been developed of which all optical components were installed in a ultra high vacuum (UHV) chamber and separeted by CVD diamond windows from the low-vacuum part of the FT-IR interferometer. The so-call UHV microscope covers very wide wavelength regions from ultraviolet to far-infrared/Terahertz wave and make possible the spectromicroscopic measurements in the whole spectral region without any replacement of the optical windows. The details of the fundamental concepts of the development and the design of the UHV microscope, and its recent application to far-infrared spectroscopy on solids under ultra high pressures are described.
