抄録
A novel Lorentz electron microscopy —twin-Foucault imaging (TFI) method— is introduced. The twin-Foucault imaging method enables observation of two Foucault images simultaneously by using an electron biprism instead of an objective aperture. The electron biprism is installed between two electron beams deflected by magnetic domains. Potential applied to the biprism deflects the two electron beams further, and two Foucault images are then obtained in one visual field. The twin-Foucault images are able to extract the magnetic domain structures and to reconstruct an ordinary electron micrograph. The Foucault method was demonstrated with 180° domain and 90°/180° domain structures of manganite La1−αSrαMnO3.
