Strain Evaluation Method around Triple Junctions Using Electron Backscatter Diffraction

Abstract

This study was aimed at examining the effect of the number of grains (representing the total measurement area) on the statistical variation of the area average of the kernel average orientation (KAM), denoted as KAM_{A, ave}, as determined through electron backscatter diffraction (EBSD). Moreover, the number of triple junctions required to obtain statistically valid results was investigated. The results indicated that at least 80–100 grains should be evaluated to reduce the statistical dispersion in plastic-strain evaluation using KAM_{A, ave}. The average triple junction KAM (KAM_{TJ, ave}) values near the random boundary tend to be higher than those near coincident site lattice (CSL) boundaries. There was a correlation between plastic strain and average triple-junction KAM (KAM_{TJ, ave}). This study highlights that KAM_TJ is useful parameters for evaluating plastic strain around the triple junctions.