Layered structures composed of ferromagnetic, half-metallic Heusler Fe2CrSi (FCS) and ferroelectric perovskite Ba0.7Sr0.3TiO3 (BSTO) have been grown on LaAlO3 (001) (LAO) substrates by magnetron sputtering. Their magnetic and ferroelectric properties have been investigated. BSTO/FCS bilayer structures are epitaxially grown on LaAlO3 substrates with BSTO (001)[100]//FCS (001)[110] relationship. The remanent polarization of 40 μC/cm2 was observed at RT in a single-layer BSTO thin film. The layered structure exhibited saturation magnetization of 400 emu/cc at RT, which is equivalent to the bulk one. Therefore, the BSTO/FCS epitaxial heterostructure is a promising candidate for fabricating multiferroic devices.
